ATPG by Fault Sampling
نویسنده
چکیده
ATPG (Automatic Test-Pattern Generation) is the process of finding an input pattern that will sensitize a specific fault, and then propagate the effect of this fault to a primary output of the device. In this paper, the algorithms of ATPG for combinational circuit are briefly introduced. It includes D-algorithm, Basic ATPG Algorithm, PODEM algorithm and testability measurements, finally the technical challenge and recent development for ATPG is discussed.
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تاریخ انتشار 2004